Quantum Nanostructures and
Nanofabrication Group

Prof. Karl K. Berggren and Dr. P. Donald Keathley

John William Simonaitis

Research Assistant
PhD Student, EECS

Massachusetts Institute of Technology
Department of Electrical Engineering and Computer Science
66 Massachusetts Ave., Suite 36-241
Cambridge, MA 02139

johnsimo@mit.edu

John is currently a Ph.D. student in Electrical Engineering at MIT. In 2018, he received a B.S. in Electrical Engineering with a minor in Physics from the University of Illinois at Urbana-Champaign. In the past he has done work with spray and blade-coated perovskite solar cells, plasma-assisted molecular beam epitaxy for GaN growth, fabricating block copolymer nanostructures, oncology, and on novel AFM sensing modes. His current work is with the quantum electron microscope project, and in his free time he enjoys hiking, running, and sailing.

QNN Publications, Conference Papers, & Thesis

Simonaitis, J. W., Krielaart, M. A. R., Koppell, S. A., Slayton, B. J., Alongi, J., Putnam, W. P., Berggren, K. K., & Keathley, P. D. (2023). Electron-Photon Interactions in a Scanning Electron Microscope. 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC), 9–11. https://doi.org/10.1109/IVNC57695.2023.10188999
Koppell, S. A., Simonaitis, J. W., Krielaart, M. A. R., Ates, O. E., Putnam, W. P., Berggren, K. K., & Keathley, Phillip. D. (2023). Applications in Microscopy and Lithography for a Heralded Electron Source. 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC), 131–133. https://doi.org/10.1109/IVNC57695.2023.10188972
Simonaitis, J. W., & Keathley, P. D. (2023). Twin experiments reveal twin electron dynamics. Nature Physics, 1–2. https://doi.org/10.1038/s41567-023-02066-8
Simonaitis, J. W., Krielaart, M. A. R., Alongi, J., Berggren, K. K., & Keathley, P. D. (2023, June 1). Apparatus for studying low energy electron-photon interactions inside a Scanning Electron Microscope. 66th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN), San Francisco, CA.
Simonaitis, J. W., Krielaart, M. A. R., Slayton, B. J., Alongi, J., Yang-Keathley, Y., Berggren, K. K., & Keathley, P. D. (2023, June 1). A Low-Energy Counting Electron Spectrometer Integrated into a Scanning Electron Microscope. 66th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN), San Francisco, CA.
Batson, E. K., Colangelo, M., Simonaitis, J. W., Gebremeskel, E., Medeiros, O., Saravanapavanantham, M., Bulovic, V., Keathley, P. D., & Berggren, K. K. (2023). Reduced ITO for transparent superconducting electronics. Superconductor Science and Technology, 36(5), 055009. https://doi.org/10.1088/1361-6668/acc280
Agarwal, A., Simonaitis, J. W., Goyal, V. K., & Berggren, K. K. (2023). Secondary electron count imaging in SEM. Ultramicroscopy, 245, 113662. https://doi.org/10.1016/j.ultramic.2022.113662
Batson, E. K., Colangelo, M., Simonaitis, J. W., Gebremeskel, E., Medeiros, O., Saravanapavanantham, M., Bulovic, V., Keathley, P. D., & Berggren, K. K. (2022). Reduced ITO for Transparent Superconducting Electronics (arXiv:2212.08573). arXiv. https://doi.org/10.48550/arXiv.2212.08573
Simonaitis, J. W., Krielaart, M., Koppell, S. A., Ates, O. E., Slayton, B. J., Feld, J., Putnam, W. P., Berggren, K. K., & Keathley, P. D. (2022, June). Coherent Electron-Photon Interactions in a 10-keV Scanning Electron Microscope. Quantum Electron Optics Conference, Haifa, Israel.
Agarwal, A., Simonaitis, J. W., Goyal, V. K., & Berggren, K. K. (2021). Secondary Electron Count Imaging in SEM. ArXiv:2111.01862 [Physics, Physics:Quant-Ph].
Simonaitis, J. W., Slayton, B., Yang-Keathley, Y., Keathley, P. D., & Berggren, K. K. (2021). Precise, subnanosecond, and high-voltage switching enabled by gallium nitride electronics integrated into complex loads. Review of Scientific Instruments, 92(7), 074704. https://doi.org/10.1063/5.0046706
Abedzadeh, N., Krielaart, M. A. R., Kim, C.-S., Simonaitis, J. W., Hobbs, R., Kruit, P., & Berggren, K. K. (2021). Electrostatic electron mirror in SEM for simultaneous imaging of top and bottom surfaces of a sample. Ultramicroscopy, 226, 113304. https://doi.org/10.1016/j.ultramic.2021.113304
Agarwal, A., Simonaitis, J. W., & Berggren, K. K. (2021). Image-histogram-based secondary electron counting to evaluate detective quantum efficiency in SEM. Ultramicroscopy, 224, 113238. https://doi.org/10.1016/j.ultramic.2021.113238
Simonaitis, J. W. (2021). Design and testing of a gated electron mirror [Thesis, Massachusetts Institute of Technology].
QNN Talks