MIT
Quantum Nanostructures and
Nanofabrication Group
Prof. Karl K. Berggren and Dr. P. Donald Keathley

John William Simonaitis

Research Assistant
PhD Student, EECS

Massachusetts Institute of Technology
Department of Electrical Engineering and Computer Science
66 Massachusetts Ave., Suite 36-241
Cambridge, MA 02139

johnsimo@mit.edu

John is currently a Ph.D. student in Electrical Engineering at MIT. In 2018, he received a B.S. in Electrical Engineering with a minor in Physics from the University of Illinois at Urbana-Champaign. In the past he has done work with spray and blade-coated perovskite solar cells, plasma-assisted molecular beam epitaxy for GaN growth, fabricating block copolymer nanostructures, oncology, and on novel AFM sensing modes. His current work is with the quantum electron microscope project, and in his free time he enjoys hiking, running, and sailing.

QNN Publications, Conference Papers, & Theses

[1]
A. Agarwal, J. W. Simonaitis, V. K. Goyal, and K. K. Berggren, "Secondary Electron Count Imaging in SEM," arXiv:2111.01862 [physics, physics:quant-ph], Nov. 2021, Accessed: Nov. 09, 2021. [Online]. Available:
[1]
J. W. Simonaitis, B. Slayton, Y. Yang-Keathley, P. D. Keathley, and K. K. Berggren, "Precise, subnanosecond, and high-voltage switching enabled by gallium nitride electronics integrated into complex loads," Review of Scientific Instruments, vol. 92, no. 7, p. 074704, Jul. 2021, doi: 10.1063/5.0046706.
[1]
N. Abedzadeh et al., "Electrostatic electron mirror in SEM for simultaneous imaging of top and bottom surfaces of a sample," Ultramicroscopy, vol. 226, p. 113304, Jul. 2021, doi: 10.1016/j.ultramic.2021.113304.
[1]
A. Agarwal, J. W. Simonaitis, and K. K. Berggren, "Image-histogram-based secondary electron counting to evaluate detective quantum efficiency in SEM," Ultramicroscopy, vol. 224, p. 113238, May 2021, doi: 10.1016/j.ultramic.2021.113238.

QNN Talks