Drift Correction for Scanning-Electron Microscopy, M.Eng. thesis, Department of Electrical Engineering and Computer Science, MIT, 2010.
Michael Snella earned his M.Eng from the MIT Department of Electrical Engineering and Computer Science in 2010. He pursued undergraduate degrees in both electrical engineering and physics at MIT. Michael was a member of the Signal Transformation and Information Representation group, as well as the Quantum Nanostructures and Nanofabrication group at RLE.
His previous research includes the characterization of novel electron calorimeters for high energy physics applications, and working to understand noise sources in Scanning Electron Microscopes, in order to develop methods to remove vibration and blur from SEM images.